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中国物理学会期刊

Bi2Sr2CaCu2-xSnxO8+δ系列 超导体的XRD和XPS研究

CSTR: 32037.14.aps.49.2055

XRD AND XPS STUDIES OF Bi2Sr2CaCu2-xSnxO8+δ SYSTEM

CSTR: 32037.14.aps.49.2055
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  • 实验研究了Bi2Sr2CaCu2-xSnxO8+δ 的X射线衍射(XRD)和光电子能谱(XPS).实验发现随着掺杂(Sn)量的增加,晶格参数a 和c都有所变化,O1s和Cu2p芯能级谱也发生了变化.实验结果表明: 在低掺杂量时,Sn主要 呈二价态;而在高掺杂浓度时呈四价态;掺Sn对超导电性的影响与其他元素的掺杂不同.这 些实验结果支持化学环境在高温超导样品的电子结构中起着重要作用的结论.

     

    X-ray diffraction and photoemission measurements have been carried out for Bi2Sr2CaCu2-xSnxO8+δ system. With Sn doping, lattice parameters a and c change somewhat, O1s and Cu2p core le vels shift differently in binding energy. From the experiment, we can deduce tha t the Sn ions are mostly in divalent state at small amount of doping, and in tet ravalent state at high doping level. Doping with Sn may have less influence on t he superconductivity than that with other elements. The results support the conc lusion that chemical environment plays a major role in the shifts of all core le vels in the high Tc superconducting samples.

     

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