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中国物理学会期刊

测量高温超导YBCO薄膜厚度的一种新方法

CSTR: 32037.14.aps.50.1451

A NOVEL METHOD TO MEASURE THE THICKNESS OF YBCO THIN FILM

CSTR: 32037.14.aps.50.1451
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  • 生长在倾斜SrTiO3衬底上的YBCO薄膜具有激光感生电压效应,响应信号的衰减时间常量与薄膜的厚度有确定的关系.作出了衰减时间常量与薄膜厚度的关系曲线,根据该曲线,由衰减时间常量就可确定薄膜的厚度

     

    The laser induced voltage effect had been found in HTSC YBCO thin film grown on vicinal cut SrTiO3 substrate. The relationship between the decay time constant of response signal and the thickness of YBCO thin film was studied. It was found that the relationship between the decay time constant and the film thickness can be fitted by a fitting curve. The film thickness can be obtained from the fitting. We discussed the error induced to the fitting.

     

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