搜索

x
中国物理学会期刊

含多层InAs量子点的双肖特基势垒二极管输运特性研究

CSTR: 32037.14.aps.50.2506

CURRENT TRANSPORT THROUGH STACKED InAs QUANTUM DOTS EMBEDDED IN A SCHOTTKY BARRIER

CSTR: 32037.14.aps.50.2506
PDF
导出引用
  • 研究了含多层InAs量子点结构的双肖特基势垒的电流输运特性,观察到了量子点的电子存储效应及其对电流的调制现象、电流多稳态现象和零点电压漂移现象.因为多量子点之间存在耦合作用,造成器件中的很多亚稳态.通过器件的输运特性显示出比含单层量子点器件更复杂的结果.随着外加电压的变化,器件经历很多弛豫过程.这些弛豫过程在电流电压曲线中造成很多电流跳跃结构和各种噪声结构

     

    We have investigated the transport properties of a metal-semiconductor-metal structure containing multi-layers of InAs quantum dots from 77 K to room temperature. Three distinct phenomena are observed in the current voltage( I-V ) curves:the hysteresis loops, current jumps and voltage offsets. Because of the coupling between the multi layered quantum dots, the devices made of these quantum dots exhibit much more complicated phenomenon than the devices containing single-layer quantum dots. The devices may undergo many metastable states and relaxation processes. These processes would induce current jump structures and noise in the I-V curve.

     

    目录

    /

    返回文章
    返回