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扫描近场微波显微镜测量非线性介电常数的理论校准系数

物理学报, 2003, 52(1): 34-38.
DOI: 10.7498/aps.52.34
CSTR: 32037.14.aps.52.34

The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy

Acta Phys. Sin., 2003, 52(1): 34-38.
DOI: 10.7498/aps.52.34
CSTR: 32037.14.aps.52.34
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  • 摘要

    从理论上分析了扫描近场微波显微镜中探针和非线性样品之间的相互作用，对非线性介电常数测量时的一个校准系数进行了理论分析和计算，得到该系数与介电常数之间的关系曲线，并对各方向的贡献和分辨率极限进行了初步探讨.

     

    Abstract

    In this paper,the interactions between the tip of the scanning tip microwave near-field microscopy and the nonlinear dielectric material were analyzed.The theoretical calibration coefficient in the measurement of nonlinear dielectric constant as a function of dielectric constant was obtained.The contributions to the coefficient from different directions and the resolution limit were also discussed.

     

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