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中国物理学会期刊

Schottky势垒高度理论计算中的平均键能方法

CSTR: 32037.14.aps.52.542

Average-bond-energy method in Schottky barrier height calculation

CSTR: 32037.14.aps.52.542
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  • 以平均键能Em作为参考能级,计算了10种不同半导体的Schottky接触势垒高度,计算值与实验值符合较好-计算值与实验值的符合程度与Tersoff的电中性能级EB方法相当,优于Harrison和Cardona等人采用sp3平均杂化能εh和介电函数隙中能级ED的计算结果-

     

    Ten barrier heights of metal-semiconductor contacts are calculated by taking the average-bond-energy as the reference level- The coincidence degree of the calculational values and the experimental values is as good as that of Tersoff's charge-neutrality point method in theoretical calculation of metal-semiconductor contacts- The calculational results are much better than that of Harrison's tight-binding method and Cardona's dielectric midgap energy method-

     

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