Thin films of iron pyrite(FeS2)have been prepared by screen print. X-ray diff raction (XRD) patterns were used to identify the nature of t he films. Special attention has been devoted to the structural parameters(cell and sulfur positional parameter), bond distances and angles, lattice constants. The procedure used in this study was the full profile refinement of x-ray powde r diffraction patterns using the Rietveld method. Here we report on the influnce of film thickness for resitivity, Hall mobility and optical energygap etc.