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中国物理学会期刊

Bi4-xLaxTi3O12-SrBi4Ti4O15,共生结构铁电材料拉曼光谱研究

CSTR: 32037.14.aps.53.3929

Study on Raman spectra of Bi_4-xLa_xTi_3O_12-SrBi_4-yLayTi_4O_15 intergrowth ferroelectrics

CSTR: 32037.14.aps.53.3929
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  • 在常温下,对La掺杂共生结构铁电陶瓷Bi_4-xLa_xTi_3O_12-SrBi_4-yLayTi_4O_15[BLT-SBLT(x+y),x+y= 0.00, 0.25,0.50,0.75,1.00,1.25,1.50]进行了拉曼光谱研究.结果表明,在掺杂量低于0.50时,La只取代类钙钛矿层中的Bi,当掺杂 量高于0.50后,部分La开始进入(Bi_2O_2)^2+层. La取代(Bi_2O_2)^2+层中的部分Bi以后,(Bi_2O_2)^2+层结构发生变化 ,原有的绝缘层和空间电荷库的作用减弱,导致材料剩余极化下降. La掺杂量增至1.50时,样品出现弛豫铁电性,这与30cm^-1以下模的软化相对应,说明La掺杂可引起材料 的结构相变.

     

    The Raman spectra of lanthanum-doped intergrowt h ferroelectric ceramics Bi_4-xLa_xTi_3O_12-SrBi_4-yLayTi_4O_15[BLT-SBLT(x+y),x+y= 0.00, 0.25,0.50,0.75,1.00,1.25,1.50]achieved at room temperature were inve stiga ted. The results show that La was substituted the Bi ions in the pseudo-perovski te blocks when La content is lower than 0.50 When La content is higher than 0.50, so me of La ions are incorporated into the (Bi_2O_2)^2+ blocks. The inco rporation of La ions into the (Bi_2O_2)^2+ layers would change th e structure of (Bi_2O_2)^2+ and destroy its functions as the insu lating layers and the space charge storage, which leads to the decrease of the remnant polarization. The relaxation characteristics observed in BLT-SBLT(1.50) are consistent with the softening of the mode lower than 30 cm^-1. This in dicates that La-doping may bring about the structural phase transition.

     

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