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提出了一种低温金属单向诱导横向晶化的多晶硅薄膜晶体管(LT-MIUC poly-Si TFT) 的技术 . 使用该技术可在大面积廉价玻璃衬底上制备出高迁移率、低漏电电流、具有较好均匀性的 多晶硅器件. 在进一步的研究中,设计了一种新型的栅控轻掺杂漏区(GM-LDD)结构,有效地 解决了在较高源漏电压下的栅诱导漏电问题. 使得LT-MIUC poly-Si TFT 更适用于高质量的 有源矩阵显示器.
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关键词:
- 金属单向诱导横向晶化 /
- 多晶硅薄膜晶体管 /
- 新型栅控轻掺杂漏区结构
In this paper the low-temperature metal-induced unilaterally crystallized (MIUC ) polycrystalline silicon thin-film transistors (TFTs) have been developed and c haracterized. These TFTs have higher field-effect mobility, lower off-state curr ent and better spatial uniformity. A new structure of gate-modulated lightly dop ed drain of TFT was proposed. It is very effective to lower gate-induced drain-l eakage current of the TFTs when a higher source drain voltage is applied to it. This type MIUC TFT is suitable to fabricate active matrices for liquid crystal and organic light-emitting diode flat-panel displays on large area glass substr ates.-
Keywords:
- metal-induced unilaterally crystallization /
- polycrystalline silicon thin-film t ransistors /
- gate-modulated lightly doped source drain







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