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中国物理学会期刊

分子束外延PbTe单晶薄膜的反常拉曼光谱研究

CSTR: 32037.14.aps.55.2021

Abnormal Raman spectra of PbTe crystalline thin films grown by molecular beam epitaxy

CSTR: 32037.14.aps.55.2021
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  • 采用分子束外延(MBE)方法在BaF2(111)衬底上生长了高质量的PbTe单晶薄膜, 拉曼光谱测量观察到了表面氧化物的振动模、布里渊区中心(q≈0)纵光学(LO)声子振动模以 及声子-等离子激元耦合模振动.随着显微拉曼光谱仪激光光斑聚焦深度的改变,各拉曼散射 峰的峰位、积分强度、半高宽等都表现出不同的变化趋势. 随着激光光斑聚焦位置从样品表 面上方3μm处变化到表面下方3μm处,PbTe外延薄膜的LO声子频率从119cm-1移 动到124cm-1 

    High quality single crystalline PbTe thin films have been grown on BaF2(111) by using molecular beam epitaxy(MBE).Raman scattering measurements have revealed the vibration modes of oxide on the surface,longitudinal optical(LO) p honon at Brillouin center q≈0,and coupled plasmon-phonon.With the variation of the focusing-depth(FD) of the pumping laser beam,the integrated intensities,p eak positions and line widths of the observed Raman peaks showed different behav iors.When FD changed from 3μm above the top-surface to 3μm below the bottom-su rface, the PbTe LO phonon frequency shifted from 119 to 124cm-1.Diffe rent Raman scattering results were also observed by comparison of the freshly su rface-etched and the as grown PbTe samples. These phenomena originated from the different vibration modes. The frequency shift of LO phonon is explained by the fact that the strain relaxation caused by the lattice mismatch between PbTe and BaF2 is as high as 4.2%.

     

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