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中国物理学会期刊

SiO2-羟基表面上金属原子的第一性原理研究

CSTR: 32037.14.aps.55.6042

First-principles study of metal atoms adsorbed on SiO2 surface

CSTR: 32037.14.aps.55.6042
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  • 采用第一性原理方法研究了SiO2-羟基表面上几种金属原子的吸附性质,发现In和Ga在SiO2-羟基表面上的结合很弱,而Fe,Co, Ni在该表面上与Si,O形成强的化学键.等势能面和扩散势垒计算表明In (Ga)的扩散激活能只有0.1—0.3 eV,表明这两种原子容易在表面上扩散.这些结果可以定性地解释纳米合成中的一些实验现象.

     

    The adsorption properties of metal atoms on the hydroxyl SiO2 surface have been studied by using first-principles calculation. It is found that In and Ga atoms are weekly bound to the surface, while Fe, Co and Ni atoms are bound to both Si and O atoms with strong chemical bonds. Potential energy surface and diffusion barrier calculations show that In (Ga) can easily diffuse on the surface because of a rather small diffusion barrier(0.1—0.3 eV). The obtained results are in close agreement with recent nano- synthesis experimental results.

     

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