搜索

x
中国物理学会期刊

掺Er/Er+O的GaN薄膜光学性质的研究

CSTR: 32037.14.aps.56.1621

Study on optical properties of Er/Er+O doped GaN thin films

CSTR: 32037.14.aps.56.1621
PDF
导出引用
  • 利用Raman散射谱研究了GaN注Er以及Er+O共注样品的振动模,并讨论了共注入O对Er离子发光的影响. 在Raman散射谱中,对于注Er的GaN样品出现了300 cm-1和670 cm-1两个新的Raman峰,而对于Er+O共注样品,除了上述两个峰外,在360 cm-1处出现了另外一个新的峰,其中300 cm-1峰可以用disorder-activated Raman scattering (DARS)来解释,670 cm-1峰是由于与N空位相关的缺陷引起的,而360 cm-1峰是由O注入引起的缺陷络合物产生的. 由于360 cm-1模的缺陷出现,从而导致Er+O共注入GaN薄膜红外光致发光(PL)强度的下降.

     

    We extend the use of Raman spectroscopy to investigate the modes of Er-implanted and Er+O co-implanted GaN, and discuss the influence of O ions on Er3+-related infrared photoluminescence (PL). It is found that Er3+ implantation introduces new Raman peaks in Raman spectra at frequencies 300 and 670 cm-1, and one additional new peak at 360cm-1 is introduced after Er+O implantation. It is proposed that the broad structure around 300 cm-1 mode originates from disorder-activated scattering (DARS). The Raman peak at 670 cm-1 is assigned to nitrogen vacancy related defects. The 360 cm-1 peak is attributed to the O implantation induced defect complexes (vacancies, interstitial, or anti-sites in the host). The appearance of the 360 cm-1 mode results in the decrease of the Er3+-related infrared PL of GaN:Er+O.

     

    目录

    /

    返回文章
    返回