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中国物理学会期刊

InGaN薄膜中电子自旋偏振弛豫的时间分辨吸收光谱研究

CSTR: 32037.14.aps.57.3853

Study of injection and relaxation of electron spins in InGaN film by time-resolved absorption spectroscopy

CSTR: 32037.14.aps.57.3853
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  • 采用飞秒时间分辨圆偏振光抽运-探测光谱对In01Ga09N薄膜的电子自旋注入和弛豫进行了研究.获得初始自旋偏振度约为02,此结果支持在圆偏振光激发下,重、轻空穴带的跃迁强度比为3∶1,而不支持1∶1或1∶094的观点同时获得自旋偏振弛豫时间为490±70ps,定性分析了自旋弛豫机理,认为BAP机理是电子自旋弛豫的主要机理.

     

    The injection and relaxation of electron spins in In0.1Ga0.9N film were studied by femtosecond time-resolved circularly polarized pump-probe spectroscopy. An initial degree of spin polarization of 02 was obtained, which agrees with 3∶1 ratio of heavy- to light-hole valence bands in transition strength, but not with the 1∶1 or 1∶0.94 ratios. A spin relaxation lifetime of 490±70ps was obtained at room temperature. The spin relaxation mechanism is discussed qualitatively, and is thought to be dominated by BAP mechanism here.

     

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