-
Films deposited at high temperature are subjected to thermal stresses in cooling down, duc to the mismatch of thermal expansion between substrate and film materials, which tends to peel off the film from the substrate. The purpose of the present work is to search the effect of thickness, Young's modulus and thermal expansion of the films on the delamination of the films. The results are helpful in reducing the possibility of the peeling of the films.
-
Keywords:
- multilayer dielectric thin films /
- infrared /
- thermal stress /
- delamination







下载: