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中国物理学会期刊

红外薄膜中热应力的研究

CSTR: 32037.14.aps.57.4316

Analysis of the thermal stress in infrared films

CSTR: 32037.14.aps.57.4316
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  • 由于红外薄膜材料和基板热膨胀系数显著不同,所以在高温基板上镀膜后降温将产生热应力,进而引起边界分层破裂现象,影响薄膜器件的牢固性.对薄膜厚度、杨氏模量和热膨胀系数对薄膜分层破裂的影响进行了研究,同时分析了薄膜设计对减小分层破裂的作用.这对减小红外薄膜系统因热应力引起的分层破裂现象具有实际应用价值.

     

    Films deposited at high temperature are subjected to thermal stresses in cooling down, duc to the mismatch of thermal expansion between substrate and film materials, which tends to peel off the film from the substrate. The purpose of the present work is to search the effect of thickness, Young's modulus and thermal expansion of the films on the delamination of the films. The results are helpful in reducing the possibility of the peeling of the films.

     

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