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中国物理学会期刊

Co:BaTiO3/Si(100)纳米复合薄膜制备、微结构及其紫外光电子能谱研究

CSTR: 32037.14.aps.57.600

Fabrication, microstructure and UPS spectra of Co: BaTiO3/Si(100) nano-composite films

CSTR: 32037.14.aps.57.600
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  • 采用脉冲激光气相沉积(PLD)方法,在Si(100)晶面上制备了Co:BaTiO3纳米复合薄膜.采用X射线衍射(XRD)结合透射电镜(TEM)方法研究了两种厚度Co:BaTiO3纳米复合薄膜的晶体结构,当薄膜厚度约为30 nm时,薄膜为单一择优取向;当薄膜厚度约为100nm时,薄膜呈多晶结构.原子力显微镜(AFM)分析表明,当膜厚为30nm时,薄膜呈现明显的方形晶粒.采用紫外光电子能谱(UPS)研究了Co的价态和Co:BaTiO3纳米复合薄

     

    Co: BaTiO3 nano-composite films were successfully fabricated by pulsed laser deposition on single crystal Si(100) surface. The micro-structure of the Co: BaTiO3 nano-composite films with about 30 nm and 100 nm thicknesses were studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The Co: BaTiO3 nano-composition films with the above thicknesses were unidirectionally prefer-oriented and polycrystalline, respectively. The atomic force microscopic (AFM) analysis indicated that there were tetragonal crystal grains in the films of about 30 nm thickness. The valence band of the films were investigated by ultraviolet photoelectron spectroscopy (UPS) in detail. The UPS spectra showed that density of electronic states (DOS) of the films with high concentration of Co grains were obviously different from that of bulk BaTiO3 single crystal.

     

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