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中国物理学会期刊

硒化前后电沉积贫铜和富铜的Cu(In1-xGax)Se2薄膜成分及结构的比较

CSTR: 32037.14.aps.58.1870

Comparison of the compositions and structures of electrodeposited Cu-poor and Cu-rich Cu(In1-xGax)Se2 films before and after selenization

CSTR: 32037.14.aps.58.1870
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  • 采用电沉积法获得了接近化学计量比的贫铜和富铜的Cu(In1-xGax)Se2(CIGS)预置层,研究比较了两种预置层及其硒化处理后的成分和结构特性.得到了明确的实验证据证明,硒化后富铜薄膜中的CuxSe相会聚集凝结成结晶颗粒分散在表面.研究表明:在固态源硒化处理后,薄膜成分基本不变;当预置层中原子比Cu/(In+Ga)12时,可以消除裂纹的产生,形成等轴状小晶粒;富铜预置层硒化时蒸发沉积少量In,Ga和Se后,电池效率已达到68%;而贫铜预置层硒化后直接制备的电池效率大于2%,值得进一步深入研究.

     

    Cu-poor and Cu-rich near stoichiometric Cu (In1-x Gax)Se2(CIGS) precursor films were obtained by one-step electrodeposition from acid aqueous baths, and the compositions and structures of the as-deposited films before and after selenization were investigated. The straightforward experimental evidence was first obtained, which showed that Cux Se compound was conglomerated as rather large crystal grains which was distributed on the surface of the film for the Cu-rich films after seleniztion. The results indicated that the film composition was changed barely after selenization. When the ratio Cu/(In+Ga)<1.1, there were many cracks on the surface of CIGS after selenization. When Cu/(In+Ga)>1.2, no cracks were formed on the surface of the thin films. The efficiency of solar cells bnilt directly from Cu-poor films after selenization achieved above 2%, which is pending further investigation. Furthermore, the efficiency of solar cells bult from Cu-rich CIGS films after selenization and deposition of a few In, Ga and Se by PVD has achieved 6.8%.

     

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