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中国物理学会期刊

SiC肖特基源漏MOSFET的阈值电压

CSTR: 32037.14.aps.58.494

The threshold voltage of SiC Schottky barrier source/drain MOSFET

CSTR: 32037.14.aps.58.494
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  • SiC肖特基源漏MOSFET的阈值电压不同于传统的MOSFET的阈值电压.在深入分析工作机理的基础上,利用二维模拟软件ISE提取并分析了器件的阈值电压.对SiC肖特基源漏MOSFET的阈值电压给出物理描述,得出当源极载流子主要以场发射方式进入沟道,同时沟道进入强反型状态,此时的栅电压是该器件的阈值电压.

     

    Threshold voltage of SiC Schottky barrier source/drain MOSFET (SBSD MOSFETs) is different from the threshold voltage of traditional MOSFETs. Based on a comprehensive analysis of the operational mechanism,the threshold voltage of SBSD MOSFET is extracted and analyzed with 2-D simulator ISE. The threshold voltage of the device is defined as the gate voltage at which carriers from the source contact enter the channel by field emission while the channel is strongly inverted.

     

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