Current-voltage （I-V） and the electrical pulse induced resistive switching （EPIR）characteristics of metal/Pr0.7Ca0.3MnO3/Pt sandwich structures, where the metal is a point-contact Pt or W electrode, are investigated by using a home-made conductive AFM. The structures with both Pt and W tips behaves as rather reproducible bipolar resistive switching （RS） with an RS ratio larger than 100. However W/Pr0.7Ca0.3MnO3/Pt structures shows EPIR under a compliance current of 10 nA and reproducible bipolar RS under a compliance current of 100 pA，which is about three orders lower than the published values and shows the potential applications in low power memory device. Further analysis of I-V characteristics at different positions of sample，under different current compliances， with different contact areas of device suggests that an enhanced oxygen vacancy migration due to point contact induced local intense electrical field， gives rise to a stable RS for Pt/Pr0.7Ca0.3MnO3/Pt devices.