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中国物理学会期刊

电沉积Cu(In, Ga)Se2预置层硫化退火制备Cu(In, Ga)(Se, S)2薄膜及表征

CSTR: 32037.14.aps.59.1196

Preparation and characterization of Cu(In, Ga)(Se, S)2 thin films by sulfurization of electrodeposited Cu(In, Ga)Se2 precursors

CSTR: 32037.14.aps.59.1196
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  • 在550 ℃下的H2S气氛中退火处理电沉积制备的Cu(In,Ga)Se2(CIGS)预置层,制备了太阳电池光吸收层Cu(In,Ga)(Se,S)2(CIGSS)薄膜.采用X射线能量色散谱、俄歇电子能谱、扫描电镜、X射线衍射和拉曼光谱对退火前后的薄膜进行表征.结果表明,H2S气氛下退火能够实现薄膜中O的去除和S的掺入,同时使得各元素的纵向分布更加均匀并可消除Cu-Se微相.此外,H2S退火还可改善薄膜的结晶性能,并使S和Ga进入黄铜矿结构,薄膜晶格参数变小.

     

    The solar cell light absorber Cu(In,Ga)(Se,S)2(CIGSS) thin films were prepared by annealing the electrodeposited Cu(In,Ga)Se2(CIGS) precursors in H2S ambient at 500 ℃. The precursors and annealed films were characterized by energy dispersive X-ray spectroscopy, Auger electron spectroscopy, scanning electron microscopy, X-ray diffraction and Raman scattering. The results show that the complete removal of oxygen atom from the film and a substitution of Se by S can be achieved by H2S-annealing. Furthermore, the depth profiles of constituent elements become more uniform, and the Cu-Se micro-phase can be eliminated by H2S-annealing. Moreover, the CIGSS films have good crystallinity and smaller crystal lattice parameters with S and Ga incorporation into the chalcopyrite structure.

     

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