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中国物理学会期刊

p型GaN低温粗化提高发光二极管特性

CSTR: 32037.14.aps.59.1233

Improved properties of light emitting diode by rough p-GaN grown at lower temperature

CSTR: 32037.14.aps.59.1233
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  • 利用金属有机物化学气相沉积技术在蓝宝石衬底上低温生长GaN: Mg薄膜,对不同源流量的GaN:Mg材料特性进行优化研究.研究表明二茂镁(CP2Mg) 和三甲基镓(TMGa)物质的量比([CP2Mg]/[TMGa])在1.4×10-3—2.5×10-3范围内,随[CP2Mg]/[TMGa]增加,晶体质量提高,空穴浓度线性增加.当[CP2Mg]/[TMGa]为2.5×10-3时获得空穴浓度与在较高温度生长获得的空穴浓度相当,且薄膜表面较粗糙.采用 [CP2Mg]/[TMGa]为2.5×10-3的p型GaN层制备的发光二极管,在注入电流为20 mA时,输出光强提高了17.2%.

     

    GaN: Mg films have been grown on sapphire at low temperature by metal-organic chemical vapor deposition, the properties of different source flux GaN: Mg materials were studied. When the molar ratio of CP2Mg and TMGa is between 1.4×10-3 and 2.5×10-3, the quality of crystal was improved with the increasing molar ration, and the hole concentration was increased linearly. When the molar ratio is 2.5×10-3,the concentration is equal to that of the film grown at higher temperature, and the surface morphology is more coarser. Taking the p-GaN layer with molar ratio of CP2Mg and TMGa of 2.5×10-3 as the light-emitting diode, when the inject current is 20 mA, the output light power was increased by 17.2%.

     

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