搜索

x
中国物理学会期刊

硅基超晶格Si1-xSnx/Si的能带结构

CSTR: 32037.14.aps.59.4843

Band structure of Si-based superlattices Si1-xSnx/Si

CSTR: 32037.14.aps.59.4843
PDF
导出引用
  • 由于Si基发光材料能与现有的Si微电子工艺兼容,其应用前景被广泛看好. 设计具有直接带隙的Si基材料,备受实验和理论研究者的关注. 本文根据芯态效应、电负性差效应和对称性效应设计了Si基超晶格Si1-xSnx/Si. 其中Si0.875Sn0.125/Si为直接带隙材料. 在密度泛函框架内,采用平面波赝势法计算表明,Si0.875Sn0.125 

    The prospects of Si-based optical emitting materials are optimistic because the materials are compatible with silicon microelectronics technology. Therefore, many experimental and theoretical studies are directed to the design of direct band-gap Si-based materials. Based on the core state effect, the electronegativity differences effect of component atoms and the symmetry effect, Si-based superlattices Si1-xSnx/Si were designed. We found that Si0.875Sn0.125/Si is a direct band-gap material. In the density functional theory frame, the results of plane pesupotential method show that Si0.875Sn0.125/Si is a direct band-gap superlattice with minimum band-gap at Γ point. We predict that the band gap of the material is 0.96 eV with the help of GW approximation method.

     

    目录

    /

    返回文章
    返回