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中国物理学会期刊

KTa1-xNbxO3晶体生长固/液边界层结构的微区研究

CSTR: 32037.14.aps.59.5085

Micro-structure of growth solid-liquid boundary layer of KTa1-xNbxO3 crystal

CSTR: 32037.14.aps.59.5085
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  • 测量了KTa1-xNbxO3(KTN)晶体在常温和高温下的Raman光谱;实时测量了晶体生长过程中,固/液边界层内以及边界层两侧的晶体和熔体的高温显微Raman光谱.通过光谱分析获得了KTN晶体生长固/液边界层内的结构特征,以及晶体生长基元从熔体结构经边界层过渡到晶体结构的变化规律.研究表明,KTN熔体中的 结构基团进入到生长边界层后逐步转化为 八面体结构基团,已具有KTN单胞的一些特征.进而讨论了以 八

     

    Raman spectra of KTa1-xNbxO3(KTN) single crystal,its melt, and the solid-liquid boundary layer in the growing process at different temperatures were measured in-situ. The structure transformation in KTN crystal growth process was investigated. The results showed that the Ta/NbO3 entities came into solid-liquid boundary layer from KTN melt, and they were transformed to Ta/NbO6 octahedron entities. And the structure of Ta/NbO6 octahedron entity was just like that of KTN single cell. Regarding Ta/NbO6 octahedron as growth units, the growth habit of KTN crystal in which the (100), (1-00), (010) and (01-0) faces are easily revealed was discussed. The thickness of the growth solid-liquid boundary layer of KTN crystal was about 80—90 μm.

     

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