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中国物理学会期刊

深亚微米SOI射频 LDMOS功率特性研究

CSTR: 32037.14.aps.60.018501

Study on power characteristics of deep sub-micron SOI RF LDMOS

CSTR: 32037.14.aps.60.018501
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  • 提出了一种SOI LDMOS大信号等效电路模型,并给出了功率增益和输入阻抗表达式. 基于制备的深亚微米SOI射频LDMOS,测试了功率增益和功率附加效率. 深入研究了SOI LDMOS功率特性与栅长,单指宽度,工作电压和频率之间关系. 栅长由0.5 μm减到0.35 μm时,小信号功率增益增加44%,功率附加效率峰值增加9%. 单指宽度由20 μm增加到40 μm,600 μm /0.5 μm器件小信号功率增益降低23%,功率附加效率峰值降低9.3%. 漏端电压由3 V增加到5 V,600 μm /0.3

     

    A large signal equivalent circuit model of SOI LDMOS is proposed. Power gain and power-added efficiency of n-type LDMOS are modeled. Deep sub-micron SOI LDMOS was fabricated and measured. We investigated the dependence of SOI LDMOS power characteristics on channel length, single gate finger width, supply voltage and working frequency. Power gain and power-added efficiency are increased by 44% and 9%, respectively, with channel length reduction from 0.5 μm to 0.35 μm. When single gate finger width is increased from 20 μm to 40 μm, power gain and power-added efficiency of 600 μm /0.5 μm device are decreased by 23% and 9.3%, respectively. Power-gain and power-added efficiency are increased by 13% and 5.5%, respectively, with supply voltage increased from 3 V to 5 V. When the working frequency is increased from 2.5 GHz to 3.0 GHz, power gain and power added efficiency of LDMOS are decreased by 15% and 4.5%, respectively.

     

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