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中国物理学会期刊

研究一维掺杂声子晶体缺陷模的解析方法

CSTR: 32037.14.aps.60.044302

Analytic method of studying defect mode of 1D doped phononic crystal

CSTR: 32037.14.aps.60.044302
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  • 为了对一维掺杂声子晶体的缺陷模进行解析研究,利用多波束干涉原理和布洛赫定理,推导出一维掺杂声子晶体的缺陷模频率的解析公式.利用它对一维掺杂声子晶体的缺陷模进行了解析研究,得到了缺陷模频率的变化规律.该方法克服了其他方法不能对缺陷模进行解析研究的不足,是一种研究一维掺杂声子晶体的缺陷模的精确、有效方法.

     

    For the analytic study of the defect mode of 1D doped phononic crystal, the multiple-beam interference method and Bloh theorem are adopted, the analytical formula of defect mode is derived and the defect mode of 1D doped phononic crystal is studied. The varition law of defect mode is obtained. The method in freed from the weaknewes of other methods that cannot carry on the analysis of defect mode. The method is valid and accurate method of studying the defect mode of 1D doped phononic crystal.

     

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