搜索

x
中国物理学会期刊

N掺杂Cu2O薄膜的光学性质及第一性原理分析

CSTR: 32037.14.aps.61.047104

Optical properties of N-doped Cu2O films and relevant analysis with first-principles calculations

CSTR: 32037.14.aps.61.047104
PDF
导出引用
  • 采用射频磁控溅射技术, 在不同温度下制备了N掺杂Cu2O薄膜.透射光谱分析发现, N掺杂导致Cu2O成为允许的带隙直接跃迁半导体, 并使Cu2O的光学禁带宽度增加.不同温度下沉积的薄膜光学禁带宽度Eg=2.52± 0.03 eV.第一性原理计算表明, N掺杂导致Cu2O的禁带宽度增加了约25%, 主要与价带顶下移和导带底上移有关, 与实验报道基本符合.N的2p电子态分布不同于O原子, 在价带顶附近具有较大的态密度是N掺杂Cu2O变成允许的带隙直接跃迁半导体的根本原因.

     

    N-doped Cu2O films are deposited at different temperatures by sputtering a CuO target in the mixture of Ar and N2. By the analysis of transmission spectra, it is found that the N-doped Cu2O films are changed into a direct allowed band-gap semiconductor and the optical band gap energy is enlarged to 2.52±0.03 eV for the films deposited at different temperatures. The first-principles calculations indicate that the energy band gap increase by 25%, which is in good agreement with the experimental result. The change from a direct forbidden band-gap transition to a direct allowed band-gap transition can be attributed to the occupation of 2p electrons of N at the top of valence band in the N-doped Cu2O film.

     

    目录

    /

    返回文章
    返回