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中国物理学会期刊

重离子轰击Ta靶引起的多电离效应

CSTR: 32037.14.aps.61.193201

Multiple ionization effect of Ta induced by heavy ions

CSTR: 32037.14.aps.61.193201
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  • 在兰州重离子加速器国家实验室分别测量了H+, He2+, Ar11+和Xe20+离子轰击Ta表面过程中辐射的X射线谱, 并得到了Ta特征X射线谱中M (M3N5)和N (M4,5N6,7)线的强度, 即I和I. 分析结果表明, 强度比值I/I 随着入射离子原子序数的增加而显著增加, 这是由于碰撞过程中Ta原子的多电离效应使M3支壳层的荧光产额3产生了显著增强.

     

    The M X-ray spectra of Ta induced by H+, He2+, Ar11+ and Xe20+ are measured in Heavy Ion Research Facility in Lanzhou. The intensities of M (M3N5) and N (M4,5N6,7), i.e. I and I, are also derived from the spectra. It is found that the intensity ratio of I/I increases with the increase of projectile atomic number. The results show that the M3-subshell fluorescence yield 3 of Ta target is greatly enhanced, owing to multiple ionization effect in collision with heavy ions.

     

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