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中国物理学会期刊

考虑自热效应的互连线功耗优化模型

CSTR: 32037.14.aps.62.016601

A novel interconnect-optimal power model considering self-heating effect

CSTR: 32037.14.aps.62.016601
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  • 基于互连线的分布式功耗模型, 考虑自热效应的同时采用非均匀互连线结构, 提出了一种基于延时、带宽、面积、最小线宽和最小线间距约束的互连动态功耗优化模型. 分别在90 和65 nm 互补金属氧化物半导体工艺节点下验证了功耗优化模型的有效性, 在工艺约束下同时不牺牲延时、带宽和面积所提模型能够降低高达35%互连线功耗.该模型适用于片上网络构架中大型互连路由结构和时钟网络优化设计.

     

    Based on the distributed interconnect power model, a novel dynamic power model is presented in this paper, in which a non-uniform interconnection structure is adopted. This model takes into account the self-heating effect and is constrained by delay, bandwidth, area, minimum interconnect width and minimum interconnect space. The validity of the proposed model is verified by 90 nm and 65 nm complementary metal-oxide semiconductor technology. The results indicate that the proposed model can cause a power consumption reduction as high as 35%, and yet the delay, area, and bandwidth are not deteriorated, when compared with the conventional power model. The proposed optimal model can be used for designing large scale interconnect router and clock network in network-on-chip structure.

     

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