In the scanning magnetic domain by using the conventional magnetic force microscopy (MFM), a laser beam reflection is used to detect the static magnetic force between probe and sample. Therefore, for the MFM, it is a challenge to directly detect the dynamic magnetic force between probe and sample under an external alternating-current (AC) magnetic field. In this study, it is proved that in an alternating magnetic force microscopy (A-MFM) a sensitive Co-GdO_x superparamagnetic probe can be usedto detect the dynamic magnetic force under an external AC magnetic field (frequency ω_m). In the present method, the magnetization of Co-GdO_x probe is modulated by an external AC magnetic field. Collecting ω_m and 2ω_m signals by using the combination of phase-locked loop (PLL) and lock in amplifiers can accurately represent the static (DC, which stands for direct current) magnetic field areas (the external AC magnetic field has no effect on the magnetized status of the sample) and dynamic (AC) magnetic field areas (the external AC magnetic field changes the magnetized status of the sample) of an anisotropic Sr ferrite sintered magnet at the same time, respectively. The Sr ferrite sample is a single-domain-type magnet where magnetization mainly changes via magnetic rotation. The A-MFM method can measure the strength and identify the polarities of the static magnetic field of sample with a DC demagnetized state. By modifying the traditional tapping-lift mode into a tapping-multiply lift mode, the A-MFM by using superparamagnetic tips can measure the static and dynamic magnetic field distribution in three-dimensional (3D) space. It is proved that the static and dynamic magnetic field as a function of the distance z between probe and sample are both expressed as H_z(z) = H_z(0)·exp(–kz). The experimental data are consistent with the previous theoretical calculations. The A-MFM can be used to study the dynamic magnetization process and to evaluate the magnetic homogeneity (microstructural homogeneity) of magnetic materials.