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本文用X射线双晶衍射平行排列(n,-n)的方法,观察了α-LiIO3单晶体生长过程点阵常数a与c不规则的不均匀性以及在静电场作用下c的起伏现象。观测出在静电场作用下a与c的变化和沿电场方向晶体表面层存在点阵常数的梯度。从而,证明了l≠0的晶面在静电场作用下,中子衍射的增强是由于在z轴向点阵常数c存在梯度的观点。同时,(010)晶面中子衍射强度在同样静电场作用下不增强的实验事实,从本实验结果,可以认为是点阵常数a原有的不均匀性较大,掩盖了a的梯度所致。The irregular variation of lattice constants of the α-LiIO3 single crystal originated in the growth process and the fluctuation phenomena of lattice constants under the action of an electrostatic field were investigated by an X-ray double-crystal spectro-meter in the (n, -n) arrangement.The results obtained support the view point that the enhancement of neutron diffraction intensity of the l≠0 reflection under the action of an electrostatic field along z-axis is due to the existence of a gradient of lattice constant c.
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