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中国物理学会期刊

LiNbO3晶体中缺陷的X射线形貌研究

CSTR: 32037.14.aps.29.374

X-RAY DIFFRACTION TOPOGRAPHIC STUDY OF CRYSTAL DEFECT IN LiNbO3

CSTR: 32037.14.aps.29.374
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  • 用X射线透射扫描形貌方法观察了直拉法生长LiNbO3晶体中各种类型点阵缺陷,诸如铁电畴壁、生长层、位错、亚晶界和胞状组织等;用不同衍射矢量对001和210方向生长的晶体的形貌消象规律,结合X射线铁电异常散射效应和光学显微观察,讨论了晶体中180°铁电畴和生长层的衬度及其分布,并研究了LiNbO3晶体中180°畴壁形成及其相互关系。

     

    Various kinds of crystal defects, such as ferroelectric domain boundaries, growth bands, dislocations, subgrain boundaries and cellular structures, etc. in Czochraski-grown ferroelectric LiNbO3 single crystals were investigated by X-ray transmission topographic technique. The defects were identified by means of invisibility conditions using different diffractions, as well as X-ray anomalous scattering effect and optical microscopy. We have discussed the formation of domain boundaries in LiNbO3 and their relation to the growth bands.

     

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