-
通过光双折射貌相法研究了YAG单晶体中位错、包裹物以及生长层间的关系,结果表明,包裹物优先吸附于固液界面上的位错露头点,而包裹物的大小与该处生长台阶的大小有关。The relationship between the dislocations, the inclusions and the growth striations in YAG single crystals were studied with birefringence topography. The experimental evidence shows that the inclusions are adsorped preferentially at the outcrops of dislocations at the solid-liquid interface and the relative sizes of the inelusions correspond to the heights of growth-steps which are related to the normal components of Burgers vectors of dislocations.
计量
- 文章访问数: 6191
- PDF下载量: 451
- 被引次数: 0