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非晶态Cu+导体分相和晶化行为的XRD和SEM研究

杨原 侯建国 俞文海

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非晶态Cu+导体分相和晶化行为的XRD和SEM研究

杨原, 侯建国, 俞文海

XRD AND SEM STUDY ON THE PHASE SEPARATION AND CRYSTALLIZATION BEHAVIOR FOR AN AMORPHOUS Cu+ CONDUCTOR

YANG YUAN, HOU JIAN-GUO, YU WEN-HAI
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  • 对非晶态Cu+快离子导体0.4CuI-0.3Cu2O-0.3P2O5在等温热处理条件下测量离子电导率的同时,进行了X射线衍射(XRD)与扫描电子显微术(SEM)研究。结果表明:初始的非晶态材料是分相的;随着等温热处理,分离的非晶第二相逐渐消失,并发生非晶态晶化;晶态的γ-CuI与Cu2P2O7先后析出,逐渐长大。此材料的分相和晶化行为同电导率反常性的对应,再一次证实了非晶态快离子导体中的相界效应及其普遍意义。
    The X-ray diffraction (XRD) and scanning electron microscopy (SEM) study was carri-ed out for an amorphous Cu+ conductor 0.4CuI-0.3 Cu2O-0.3P2O5 with the simultaneous conductivity measurement in the isothermal heat treament process. The results indicated that the initial amorphous material was phase-separated. In the course of time, the separated amorphous phase disappeared, the crystalline γ-Cul and Gu2P2O7 formed in sequence and grew up gradually. The correlation of the phase separation and crystallization behavior with the con-ductiyity anomaly confirmed again the interface effect between different phases in amorphous fast ionic conductors and its universality.
    • 基金项目: 国家自然科学基金
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  • 文章访问数:  6582
  • PDF下载量:  618
  • 被引次数: 0
出版历程
  • 收稿日期:  1989-06-08
  • 刊出日期:  1990-02-05

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