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中国物理学会期刊

使用发射光谱对感应耦合CF4/CH4等离子体中C2基团形成机理的研究

CSTR: 32037.14.aps.54.1653

Studies on C22 radical by optical emission spectroscopy in an induc tively-coupled CF44/CH44 plasma

CSTR: 32037.14.aps.54.1653
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  • 利用强度标定的发射光谱法,研究了感应耦合CF44/CH44等离 子体中空间基团的 相对密度随宏观条件(射频输入功率、气压和流量比)的变化情况. 研究表明:在所研究的 碳氟/碳氢混合气体放电等离子体中除了具有丰富的CF,CF22,CH,H和F等活 性基团外 ,还同时存在着C22基团,其相对密度随着放电功率的提高而增加;随着气压 的上升呈 现倒“U”型的变化. C22随流量比R(R=[CH4

     

    In this paper, actinometric optical emission spectroscopy (AOES) is used to inve stigate the discharge of CF44 and CH44 mixtures. Relat ive concentratio ns of radicals in an inductively_coupled plasma are determined as functions of rf input power, pressure and the gas flow ratio R (R=[CH44]/[CH 44]+[CF44]). It is found that CF,CF22 ,CH,H and F radicals exis t in the CF44/CH44 plasma as well as C22 radical. The relative co ncentration of C22 increases with increasing power, and shows a rev erse “U” shape tendency with increasing pressure. As R increases, the variati on of the relative concentration of C22 is not monotonical. It reac hes a ma ximum value when R=75%, then decreases followed by almost no change with the further increase of R. Based on these results, it is concluded that gas_pha se reaction from the reaction of CF and CH (CF+CH→C22+HF ) contribu tes to the production of C22 radical. At the same time, activation reaction model of radical collision is suggested. Result of simulation agrees well with that of experiment.

     

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