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中国物理学会期刊

甚高频高速沉积微晶硅薄膜的研究

CSTR: 32037.14.aps.57.6002

Research on the high-rate deposition of μc-Si:H by VHF-PECVD

CSTR: 32037.14.aps.57.6002
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  • 采用甚高频化学气相沉积(VHF-PECVD)技术制备了系列微晶硅(μc-Si:H)薄膜样品,重点研究了硅烷浓度、功率密度、沉积气压和气体总流量对薄膜沉积速率和结晶状态的影响,绘制了沉积气压和功率密度双因素相图. 以0.75nm/s的高速沉积了器件质量级的微晶硅薄膜,并以该沉积速率制备出了效率为5.5%的单结微晶硅薄膜电池.

     

    The μc-Si:H films were deposited by VHF-PECVD, the effects of silane concentration, power density, deposition pressure and total flow rate on the deposition rate and crystallization of μc-Si:H were extensively studied. Phase diagram in the plot of deposition pressure against power was determined. The deposition rate of μc-Si:H has reached 0.75nm/s. Incorporating such μc-Si:H films as i-layer, the single-junction solar cell on glass substrate showed an conversion efficiency of 5.5%.

     

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