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流场中介质流与壁面间剪切应力的定量测量,在运动物体例如航天器等的表面流场观测与表面减阻等领域有重要意义.本文采用向列相液晶涂层技术针对介质流与固体壁面间的剪切应力展开定量测量.首先利用液晶弹性变形理论建立了向列相分子在剪切应力场作用下旋光性光强信号与剪切应力大小的定量模型;进而,在固体表面制备了5 CB与7 CB向列相液晶涂层, 采用搭建的实验装置对不同剪切应力场下的测试涂层的光强进行了测试与理论模型的计算模拟, 测试结果与定量模型相当吻合;进一步探讨了液晶涂层测试技术的极限剪切应力、 灵敏范围以及涂层膜厚、分子弹性等关键影响因素.Measurement of wall shear stress (WSS) has important significance in many fields, such as spacecraft surface flow visualization and drag reduction of solid-liquid interface. Various measuring methods have been developed with the rapid development of micro and nano technology. This paper focuses on the measurement of WSS by using nematic liquid crystal coating. A quantitative model is built to describe the relationship between the variations of director orientation and the WSS based on the curvature elasticity theory of liquid crystal. Then an experiment setup is built to verify this model using 5 CB and 7 CB through the optical method. There is good consistence between the theoretical model and experiment results. Finally, the WSS measuring limits and influencing factors are discussed such as the thickness of the liquid crystal layer, the elastic coefficient of the molecule and measurement resolution.
[1] Naughton J W, Sheplak M 2002 Progress in Aerospace Sciences 38 515
[2] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 China Mechanical Engineering 20 2081
[3] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 Tribology 29 200
[4] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 Nanotechnology and Precision Engineering 7 428
[5] Wang X, Zhang X J, Meng Y G, Wen S Z 2008 Journal of Tsinghua University (Science and Technology) 48 1302
[6] Xiong Y, Zhang X J, Zhang X H, Wen S Z 2010 Acta Phys. Sin. 59 7998 (in Chinese) [熊毅, 张向军, 张晓昊, 温诗铸 2010 物理学报 59 7978]
[7] Lu H F, Jiang C Y, Deng J J, Ma B H, Yuan W Z 2010 Chin. J. Mech. Eng. 46 54
[8] Heng Z, Jian Q, Ming X, Cheng H, Jiang W M 2008 Journal of Experiments in Fluid Mechanics 22 94
[9] Tanner L H, Blows L G 1976 Journal of Physics E Scientific Instruments 9 194
[10] Fukang J 1997 Proceedings of the Tenth Annual International Workshop on Micro Electro Mechanical Systems Nagoya, January 26-30, 1997 p465
[11] Lofdahl L, Gad-el-Hak M 1999 Measurement Science {& Technology} 10 665
[12] Buttsworth D R, Elston S J, Jones T V 1998 Journal of Turbomachinery-Transactions of the Asme 120 847
[13] Buttsworth D R, Elston S J, Jones T V 1998 Measurement Science {& Technology} 9 1856
[14] Reda D C, Wilder M C, Farina D J, Zilliac G 1997 Aiaa Journal 35 608
[15] Fujisawa N, Oguma Y, Nakano T 2009 Measurement Science {& Technology} 20 065403
[16] Parmar D S 1991 Rev. Sci. Instru. 62 474
[17] Fujisawa N, Aoyama A, Kosaka S 2003 Measurement Science {& Technology} 14 1655
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[1] Naughton J W, Sheplak M 2002 Progress in Aerospace Sciences 38 515
[2] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 China Mechanical Engineering 20 2081
[3] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 Tribology 29 200
[4] Wang X, Zhang X J, Meng Y G, Wen S Z 2009 Nanotechnology and Precision Engineering 7 428
[5] Wang X, Zhang X J, Meng Y G, Wen S Z 2008 Journal of Tsinghua University (Science and Technology) 48 1302
[6] Xiong Y, Zhang X J, Zhang X H, Wen S Z 2010 Acta Phys. Sin. 59 7998 (in Chinese) [熊毅, 张向军, 张晓昊, 温诗铸 2010 物理学报 59 7978]
[7] Lu H F, Jiang C Y, Deng J J, Ma B H, Yuan W Z 2010 Chin. J. Mech. Eng. 46 54
[8] Heng Z, Jian Q, Ming X, Cheng H, Jiang W M 2008 Journal of Experiments in Fluid Mechanics 22 94
[9] Tanner L H, Blows L G 1976 Journal of Physics E Scientific Instruments 9 194
[10] Fukang J 1997 Proceedings of the Tenth Annual International Workshop on Micro Electro Mechanical Systems Nagoya, January 26-30, 1997 p465
[11] Lofdahl L, Gad-el-Hak M 1999 Measurement Science {& Technology} 10 665
[12] Buttsworth D R, Elston S J, Jones T V 1998 Journal of Turbomachinery-Transactions of the Asme 120 847
[13] Buttsworth D R, Elston S J, Jones T V 1998 Measurement Science {& Technology} 9 1856
[14] Reda D C, Wilder M C, Farina D J, Zilliac G 1997 Aiaa Journal 35 608
[15] Fujisawa N, Oguma Y, Nakano T 2009 Measurement Science {& Technology} 20 065403
[16] Parmar D S 1991 Rev. Sci. Instru. 62 474
[17] Fujisawa N, Aoyama A, Kosaka S 2003 Measurement Science {& Technology} 14 1655
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