A new type of pinhole-assisted point backlighter developed and optimized based on experimental research performed on Shenguang-Ⅲ proto-type facility is presented. High quality images of tungsten micro wires and capsule are acquired with a 4.75 keV X-ray point source produced by 1600 J/1 ns/351 nm laser interaction with 3 μm Ti target. Detailed parameters of this backlighter are also obtained using a multiple diagnostic device. The results indicate that pinhole-assisted point-projection backlighter has advantages of high intensity and high spatial resolution, and can be widely used in high energy density physics research.