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中国物理学会期刊

空间电子辐射环境中绝缘介质电荷沉积特性及陷阱参数研究综述

CSTR: 32037.14.aps.68.20191252

Review of charge deposition characteristics and trap parameters of dielectric in space electron radiation environment

CSTR: 32037.14.aps.68.20191252
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  • 空间电子辐射环境中绝缘介质充放电特性与介质表面电荷交换过程或内部电荷迁移过程密切相关. 介质表面/内部电荷运动很大程度上取决于材料的微观特性, 空间电荷与陷阱是反映绝缘介质微观特性的重要参数. 本文综述了电子辐射环境中绝缘介质内部空间电荷和陷阱的形成、作用机理、测量方法、存在的问题及国内外研究现状. 首先, 简要介绍了入射电子与介质材料的相互作用机理及沉积电荷的形成; 分析了电子束辐射下介质内部电荷迁移模型, 辐射诱导电导模型(RIC模型)和电子-空穴对的产生/复合模型(GR模型)的优缺点; 对比分析了经典电声脉冲法(PEA)以及适用于电子束辐射下空间电荷测量的“短路PEA”和“开路PEA”, 并总结了电子辐射下PEA装置设计中存在的主要技术难点; 其次, 简要介绍了电子束辐射下陷阱的形成及作用机理, 分析了聚合物介质陷阱参数的提取方法, 如热刺激电流法、表面电位衰减法(电晕注入方式或电子辐射方式)、空间电荷衰减法, 指出在同一真空环境中完成电子注入和表面电位测量的方法较适合空间介质材料陷阱参数的表征, 并以聚酰亚胺为例, 进行了陷阱参数提取; 最后, 从理论模型、参数表征和测量技术等方面, 展望了空间绝缘介质亟需解决的科学问题.

     

    Charging and discharging characteristics of dielectric in space electron radiation environment are closely related to the surface charge exchange process and internal charge transfer process. Surface or internal charge movement of dielectric depends largely on the microscopic characteristics of the material, and space charge and trap are important parameters reflecting the microscopic characteristics of dielectric. In this work, the formation, mechanism, measurement method, existing problems and research status of space charge and trap in insulation material in electronic radiation environment are reviewed. Firstly, the interaction mechanism between incident electron and dielectric material and the formation of deposition charge are briefly introduced. The advantages and disadvantages of radiation-induced conductance model and electron-hole pair generation/recombination model are analyzed. The classical electro-acoustic pulse method (PEA) and " short circuit PEA” and " open circuit PEA” which are suitable for space charge measurement under electron beam radiation are compared with each other and analyzed, and further, the main technical difficulties in designing PEA device under electron beam radiation are reviewed. Secondly, the methods of extracting trap parameters, including thermal stimulation current method, surface potential decay method, space charge decay method are compared with each other.
    It is pointed out that the method of injecting the electrons and the method of measuring the surface potential in the same vacuum environment are more suitable for measuring the trap parameters of space dielectric materials. Finally, the scientific problems that need solving in space insulation are prospected from the aspects of theoretical model, parameter characterization and measurement technology.

     

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