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中国物理学会期刊

基于CT扫描数据的X射线能谱估计方法

CSTR: 32037.14.aps.72.20222307

Computed tomography data based X-ray spectrum estimation method

CSTR: 32037.14.aps.72.20222307
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  • X射线能谱在计算机层析成像(computed tomography, CT)图像硬化校正、双能谱CT成像、辐射剂量计算等方面具有重要作用. 常用的估计X射线能谱分布的方法, 利用X射线穿过不同厚度模体的衰减数据, 来间接估计X射线能谱分布. 由于该问题具有严重的病态性, 因此如何鲁棒和准确地求解是能谱估计问题的关键. 本文提出了一种利用CT扫描数据来估计X射线能谱分布的方法. 该方法中考虑了谱估计和图像重建之间的相互印证关系, 即谱估计正确时重建的CT图像无硬化伪影, 而重建图像无硬化伪影时, 则说明估计的谱准确. 该方法利用这种相互印证关系构造优化模型, 通过交替迭代求解, 估计能谱分布和重建无硬化伪影的CT图像. 数值实验和实际实验结果表明, 该方法可以准确、鲁棒地估计出 X 射线能谱.

     

    X-ray spectrum plays an important role in computed tomography (CT) beam hardening correction, dual spectral X-ray CT imaging, and radiation dose calculation. The commonly used method to estimate X-ray spectrum is to estimate the spectra indirectly by using the attenuation data of X-ray passing through the phantoms with different thickness. Since the problem is seriously ill-conditioned, how to choose a suitable mold, establish scanning models and construct solving methods to improve the robustness and accuracy of energy spectrum estimation is the focus of this paper. In this work, in the absence scattering, we present a method to estimate the distribution of the X-ray spectrum by using CT scanning data. In this method, the mutual verification relationship between spectral estimation and image reconstruction is considered. That is, when the spectral estimation is correct, the spectral information can be used to construct a correction algorithm to remove hardening artifacts, and the image without hardening artifacts can be obtained. When the reconstructed image has no hardening artifact, it can indirectly prove that the estimated spectrum is accurate. For single-material molds, when there is no hardening artifact, CT images are fragmentation constant, which can be described by image total variation (TV) minimum. In this method, the mutual corroboration relationship is used to construct an optimization model, and then the X-ray spectrum is estimated and CT images without hardening artifacts are reconstructed through alternate iterative solutions. The characteristic of this method is that it does not necessitate obtaining the cross-line length of the measured mold with different thickness in advance, and it does not require high production precision of the said mold either. When there is a small amount of scattering in CT scanning data, the proposed method can also better estimate the energy spectrum, except for the large deviation in the high-energy part. However, as the scattering ratio increases, the high-energy portion of the energy spectrum will increase, resulting in the estimated spectrum differing greatly from the actual spectrum. Therefore, in the actual experiment, we add collimors in front of the X-ray source and detector to reduce the influence of scattering on the energy spectrum estimation. The numerical result and experimental result show that the proposed method can accurately and robustly estimate the X-ray energy spectrum.

     

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