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功能材料的结构设计与性能调控是材料科学与凝聚态物理领域的前沿热点问题, 功能基元的人工序构成为近年来提升材料功能特性、探索新奇物理现象的新范式. 准确理解功能基元构筑的新材料宏观物性的起源要求精确地表征功能基元的结构、形态和分布, 明晰功能基元之间耦合效应. 具有皮米测量精度的像差校正透射电子显微镜是解析低对称性材料和复杂化学体系材料原子结构、化学组成和电子组态的重要工具, 为实现高精度、多维度表征功能基元及其空间的构筑方式、建立构-效关系提供了新途径. 本文通过选取不同尺度下的代表性功能基元, 论述了皮米尺度下功能基元的本征特性与空间排布, 及其与宏观物性之间的关联, 突出了像差校正透射电子显微学的突破和发展, 为理解基元构筑的功能材料功能性起源提供了坚实的基础.
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关键词:
- 功能材料 /
- 功能基元 /
- 像差校正透射电子显微镜 /
- 皮米尺度
Structure design and performance regulation of functional materials are the cutting-edge hot topic in the field of materials science and condensed mater physics. Constructing hierarchical structures with functional units recently has become a new paradigm to improve the functionality of functional materials and explore new physical phenomena. Understanding the origin of physical properties of functional materials constructed by functional units requires us to precisely characterize the structure, configuration and spatial patterns of functional units, and their couplings. Aberration-corrected transmission electron microscopy has proven to be powerful in revealing the atomic structure, chemistry and electronic configuration of the functional materials with low symmetry and complex compositions, which provides a new avenue to reveal the functional units and their spatial patterns with high precision from different aspects and finally establish the structure-propertys relationship. In this paper, we summarize the inherent characteristics of typical functional units with different sizes, and the hierarchical structures constructed by functional units at the picoscale, by which the relationship between structures and functionality is revealed. The breakthrough and development of aberration-corrected transmission electron microscopy lays a solid foundation for understanding the origin of functionality of new materials constructed by functional units.-
Keywords:
- functional materials /
- functional units /
- aberration-corrected transmission electron microscopy /
- picoscale








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