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中国物理学会期刊

单空位缺陷对二维δ-InSe稳定性的影响

CSTR: 32037.14.aps.73.20230904

Effect of single vacancy defects on two-dimensional δ-InSe stability

CSTR: 32037.14.aps.73.20230904
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  • 二维InSe半导体材料由于其优异的电学性能以及适中可调的带隙等优点, 引起了研究者的关注. 材料中的空位缺陷不仅影响材料的光电学特性, 还影响材料的环境稳定性. 相比于InSe材料中的其他相, δ-InSe具有更优异的材料性能, 然而关于对该材料环境稳定性影响的研究未见报道. 本文基于密度泛函理论, 系统研究了O2环境下二维δ-InSe材料的稳定性问题. 结果表明: 1)在O2环境下, 完美δ-InSe表面具有良好的惰性和稳定性, O2分子在其表面从物理吸附到解离吸附需要克服1.827 eV的势垒; 2) Se空位(VSe)的存在则会促进δ-InSe的氧化反应, 被氧化的过程仅需克服0.044 eV的势垒, 说明VSe的存在使δ-InSe在O2环境下的稳定性显著下降, 此外被O2分子氧化的δ-InSe单层有利于H2O分子的解离吸附; 3)含有In空位(VIn)的δ-InSe被氧化的速率较慢, O2分子在VIn表面的物理吸附的吸附能和电荷转移与完美表面基本一致, 被氧化的过程需克服1.234 eV的势垒. 这一研究结果将为更好地理解单空位缺陷对δ-InSe单层的氧化行为提供理论指导, 同时为高可靠二维δ-InSe器件的实验制备提供参考.

     

    The two-dimensional (2D) semiconductor material of InSe has received much attention due to its excellent electrical properties and moderate adjustable bandgap. The vacancy defects in the material affect not only the optical and electrical properties, but also the environmental stability. Compared with other phases in InSe materials, δ-InSe has superior material properties, however, the effect of environment on this material stabilityhas not been reported. In this work, we systematically investigate the stability of 2D δ-InSe material under oxygen environment based on density functional theory. The results are shown below. Firstly, in an oxygen environment, the perfect δ-InSe surface exhibits good inertness and stability, for O2 molecules need to overcome an exceptionally high energy barrier of 1.827 eV from physical adsorption to chemical adsorption on its surface. Secondly, the presence of Se vacancies (VSe) promotes the oxidation reaction of δ-InSe, which only requires overcoming a low energy barrier of 0.044 eV. This suggests that the stability of δ-InSe in an oxygen environment is significantly reduced because of the presence of VSe. The O2 molecules oxidized δ-InSe monolayer is beneficial to the dissociation and adsorption of H2O molecules. Finally, the oxidation rate of δ-InSe with In vacancies (VIn) is slower, with the adsorption energy and charge transfer involved in the physical adsorption of O2 molecules on the VIn surface being similar to those on a perfect surface. The oxidation process needs to overcome a higher energy barrier of 1.234 eV. The findings of this study will provide theoretical guidance for better understanding the oxidation behavior of single vacancy defects in monolayer δ-InSe, and reference for experimental preparation of high-reliability 2D δ-InSe devices.

     

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