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中国物理学会期刊

半导体缺陷的电子结构计算方法研究进展

CSTR: 32037.14.aps.73.20231960

A review of first-principles calculation methods for defects in semiconductors

CSTR: 32037.14.aps.73.20231960
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  • 半导体材料的掺杂与缺陷调控是实现其应用的重要前提. 基于密度泛函理论的第一性原理缺陷计算为半导体的掺杂与缺陷调控提供了重要的理论指导. 本文介绍了第一性原理半导体缺陷计算的基本理论方法的相关发展. 首先, 介绍半导体缺陷计算的基本理论方法, 讨论带电缺陷计算中由周期性边界条件引入的有限超胞尺寸误差, 并展示相应的修正方法发展. 其次, 聚焦于低维半导体中的带电缺陷计算, 阐述凝胶模型下带电缺陷形成能随真空层厚度发散的问题, 并介绍为解决这一问题所引入的相关理论模型. 最后, 简单介绍了缺陷计算中的带隙修正方法及光照非平衡条件下掺杂与缺陷调控理论模型. 这些工作可以为半导体, 特别是低维半导体, 在平衡或非平衡条件下的缺陷计算提供指导, 有助于后续半导体中的掺杂和缺陷调控工作的进一步发展.

     

    Doping and defect control in semiconductors are essential prerequisites for their practical applications. First-principles calculations of defects based on density functional theory offer crucial guidance for doping and defect control. In this paper, the developments in the theoretical methods of first-principles semiconductor defect calculations are introduced. Firstly, we introduce the method of calculating the defect formation energy and finite-size errors to the formation energy caused by the supercell method. Then, we present corresponding image charge correction schemes, which include the widely used post-hoc corrections (such as Makov-Payne, Lany-Zunger, Freysoldt-Neugebauer-van de Walle schemes), the recently developed self-consistent potential correction which performs the image charge correction in the self-consistent loop for solving Kohn-Sham equations, and the self-consistent charge correction scheme which does not require an input of macroscopic dielectric constants. Further, we extend our discussion to charged defect calculations in low-dimensional semiconductors, elucidate the issue of charged defect formation energy divergence with the increase of vacuum thickness within the jellium model and introduce our theoretical model which solves this energy divergence issue by placing the ionized electrons or holes in the realistic host band-edge states instead of the virtual jellium state. Furthermore, we provide a brief overview of defect calculation correction methods due to the DFT band gap error, including the scissors operator, LDA+U and hybrid functionals. Finally, in order to describe the calculation of defect formation energy under illumination, we present our self-consistent two-Fermi-reservoir model, which can well predict the defect concentration and carrier concentration in the Mg doped GaN system under illumination. This work summarizes the recent developments regarding first-principles calculations of defects in semiconducting materials and low-dimensional semiconductors, under whether equilibrium conditions or non-equilibrium conditions, thus promoting further developments of doping and defect control within semiconductors.

     

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