The study of low-energy, high-charge-state ions traversing insulating nanochannels has focused on the guiding effects due to the deposition of charge, while experimental and theoretical research on the influence of image charge forces caused by the polarization of the channel walls during ion transmission is relatively scarce. In this work, the experiments on 1-keV \textN_2^ + ion beams passing through muscovite microporous membranes are conducted by combining the theoretical method. Under the condition of complete discharge of the microporous membrane, the two-dimensional angular distribution of ejected ions at the initial stage of ion beam incidence at a zero-degree inclination is measured. In previous simulation calculations, first-order image force approximation and static approximation are used to calculate the image charge forces so as to simplify the calculation process. It is found that the results obtained from these calculations are still different from the experimental results. Therefore, we refine the calculation formula for image charge forces by taking into account the full effect of these forces. In previous studies of image charge forces, the influence of ion velocity on the polarization of the channel walls was neglected. The surface dielectric response theory of the image force experienced by ions within the micropores, which depends on ion velocity and the distance between the ion and the channel wall, is used to simulate and compare with the experimental results. The influence of image charge forces caused by surface dielectric response due to ion velocity on the angular distribution of ejected ions is studied. The discrepancies between the simulated and experimental two-dimensional angular distributions are found, showing that the experimental results have a wider half-height width than the simulated results.

To explore the effects of beam divergence and the angle between the micropore axis and the beam on ion penetration and the two-dimensional angular distribution of ejected ions, simulation calculations for 1 keV \textN_2^ + under different beam conditions are conducted, with the third-order dynamic image charge forces considered. The several potential influences in the simulation calculations are analyzed, and the influences of the true state of the beam and the angle between the beam and the micropore on the difference between simulation and experiment are assessed. This work provides the possibility for studying the surface dielectric response of micropores by using ion beams as probes.