In previous studies, conducting in-situ friction measurement by atomic force microscope have remained challenging. Two-dimensional friction-force atomic force microscopy (2DFF-AFM) is a method that enables friction measurements on material surfaces at the two-dimensional scale using atomic force microscopy. By combining the torsional signal of the cantilever with the Z-direction piezoelectric feedback corresponding to the bending signal, this method achieves microscopic friction measurements at arbitrary scanning angles. This study used 2DFF-AFM method to investigate the friction behavior between silicon probes and two different substrates (amorphous silicon oxide and single-crystal sapphire) under atmospheric conditions. The results show that friction on amorphous silicon oxide is isotropic when measured with a silicon probe. Friction on single-crystal sapphire comprises an isotropic component and an anisotropic component with 90° periodicity which arises from single crystal silicon of tip, the high hardness of sapphire wears through the native oxide layer of the silicon tip, exposing the underlying single-crystal silicon. In addition, under the influence of adsorbates, both the isotropic friction signal and 90° periodic anisotropic friction signal exhibit a non-monotonic trend with increasing load, initially decreasing and then increasing. After thermal treatment of single-crystal sapphire substrates, sub-nanometer steps appears on the surface, and friction measurements show that sapphire exhibits a friction signal with a period of 180°. This directly indicates that the step structure on the sapphire surface significantly affects the anisotropic friction behavior. The 2DFF-AFM method provides an effective theoretical and practical approach for separating friction forces from different sources at the interface.