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中国物理学会期刊

冷冻透射电子显微镜技术在物理与材料领域的应用

Applications of cryogenic transmission electron microscopy in physics and materials

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  • 冷冻透射电子显微镜(cryogenic transmission electron microscopy, cryo-TEM)通过快速玻璃化冷冻技术, 可将样品固定在近原生状态, 并在低温下实现高分辨成像, 从而有效抑制或避免真空干燥、电子束辐照等过程造成的结构损伤. 凭借这一优势, cryo-TEM不仅在生物、医学等传统领域得到了广泛的应用, 近年来更是在物理、材料、化学、大气等多个学科的结构表征与机理研究中取得了颇多进展. 本文在对cryo-TEM技术路线简要介绍的基础上, 聚焦其在物理与材料领域的应用进展展开综述, 依次讨论了其在电子束敏感材料的保护机制与结构解析、空气敏感材料的无氧制样与界面分析、时间分辨cryo-TEM的方法学及其在成核和相变研究中的应用、低温环境下功能材料的原位观测, 以及与谱学、衍射和理论计算等技术联用的最新进展. 希望本文能够为cryo-TEM在物理与材料领域的更广泛的应用提供参考.

     

    Cryogenic transmission electron microscopy (cryo-TEM) preserves biological and material samples in a near-native state via ultra-rapid vitrification and enables high-resolution imaging at cryogenic temperatures, which substantially alleviates structural degradation induced by vacuum dehydration and electron beam irradiation. Capitalizing on this unique advantage, cryo-TEM has long served as a powerful characterization tool in traditional disciplines including biology and medicine. In recent years, it has also seen tremendous advances in structural characterization and mechanistic exploration across physics, materials science, chemistry and atmospheric science. This review first systematically introduces two core technical routes of cryo-TEM: the vitrification-based strategy (Sections 3 and 5) for the structural analysis of electron-beam-sensitive materials and the characterization of dynamic evolution processes, and the cryo-stage-based strategy (Sections 4 and 6) for the oxygen-free preparation and investigation of low-temperature physical properties of air-sensitive materials. Subsequently, we comprehensively summarize the state-of-the-art applications of cryo-TEM in physics and materials science, covering five key research directions: 1) the protection mechanism and atomic-scale structural resolution of electron-beam-sensitive materials (e.g., MOFs, COFs, perovskites, and hydrogels); 2) oxygen-free sample preparation and interfacial structural analysis of air-sensitive materials (e.g., Li/Na/K metal anodes, SEI/CEI films, and solid-state battery interfaces); 3) time-resolved cryo-TEM methodologies including offline sampling, on-chip integration and electron beam-induced dynamic detection, as well as their applications in probing nucleation and phase transition behaviors over timescales ranging from microseconds to months; 4) in situ cryogenic observation of the structural and functional evolution of advanced functional materials (e.g., ferroelectric domain transformation, skyrmion lattice rearrangement, charge density wave transitions, and low-temperature Li+ transport behavior); 5) the latest progress in correlative characterization technologies that integrate cryo-TEM with spectroscopy, diffraction analysis, theoretical calculations and machine learning algorithms (Section 7). This review aims to provide a comprehensive and insightful reference for further expanding the application scope of cryo-TEM in fundamental physics and advanced materials research.

     

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