The dependence of the structural relaxation of the material on the annealing temperature Ta is studied by measuring the difference of thermal elongation △l or that of the electrical resistivity △ρ and that of the thermal expansion coeffcient △α between an as-quenched and an annealed sample. △α/α0 is measured by placing an as-quenched and an annealed sample in juxtaposition and heating them with iodine-tungsten lamps. The samples expand freely and the rsitivity of the as-onerched sample, respeomparator. The experimental results are summarized by three curves, namely △α/α0 vs Ta, △l/l0 vs Ta and △ρ/ρ0 vs Ta, where α0, l0, and ρ0 are the linear expansion coefficient, the length and the resistivity of the as-quenched sample, respec lively. The obtained results are discussed.