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本文报道用X射线光电子能谱(XPS)观测Ti与铋系高温超导体相互作用过程中电子结构的变化。结果表明,Ti原子夺走超导体内部的O,在表面形成Ti—O键,在XPS探测区域内,Bi—0,Cu—O键被破坏,Cu2+和Bi3+被还原为金属态。成键氧的被夺走影响了超导体的电子结构,用标准四探针法检测得到Ti的蒸镀使薄膜的超导转变温度降低,并且不能达到零电阻。X-ray photoelectron spectroscopy has been used to investigate the interactions between Ti and bismuth-based superconductors. It is shown that Ti adatoms leach oxygen from the under-lyng superconductors, forming Ti-O bond on the surface. In the interface region, Cu-O and Bi-O bonds are destroyed, Cu2+ and Bi3+ are reduced to metallic atoms. The electronic structures of the superconductors are disrupted by the Ti adatoms. By using the standard four-probe method, it is found that after Ti deposition, the transition temperature of the thin film is 10K lower and the zero resistance can not be reached.







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