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表层氟化聚乙烯中的空间电荷

安振连 刘晨霞 陈暄 郑飞虎 张冶文

引用本文:
Citation:

表层氟化聚乙烯中的空间电荷

安振连, 刘晨霞, 陈暄, 郑飞虎, 张冶文

Space charge in surface fluorinated polyethylene

An Zhen-Lian, Liu Chen-Xia, Chen Xuan, Zheng Fei-Hu, Zhang Ye-Wen
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  • 本文试图简要地汇集近年来与近期我们所取得的关于表面氟化对聚乙烯(PE) 空间电荷行为影响的研究结果, 总结与探讨PE中的空间电荷积累与其氟化层特性和特征间的关联. 这些结果显示在氟化反应气中没有氧存在时一个非常薄的氟化层能产生有效的电荷抑制, 而当氧存在时为达到有效的电荷阻挡、需要一个具有高氟化度的非常厚的氟化层. 在影响空间电荷的诸电学因素中, 氟化层的电荷传导特性比其电荷俘获特性和介电常数或极性对阻止电荷注入材料内部更为重要, 尽管氟化层的高介电常数和被俘获的电荷会降低界面电场、因此减少电荷的电极注入. 氟化层的电荷传导特性密切关联于其自由体积, 反应混合气中存在的氧对减小自由体积、因此对电荷的抑制具有强的负面影响.
    Direct fluorination, as one of the most effective approaches to chemical modification of polymer surfaces, has been widely developed from fundamental researches to industrial applications for about forty years in chemical industry field. However, today, its investigations and applications in adjusting and controlling the electrical properties of polymers are still deficient. The present paper attempts to briefly bring together our study results obtained in recent years and recently, related to the influence of surface fluorination on space charge behavior in polyethylene (PE), and to give a concluding discussion on the correlation between space charge accumulation in PE and its fluorinated layer properties and characteristics. The results show that a very thin fluorinated layer can yield effective charge suppression in the absence of oxygen in the reactive gas mixtures, whereas a very thick fluorinated layer with a high degree of fluorination is needed to achieve the effective charge blocking in the presence of oxygen. Among the electrical factors influencing space charge, charge transport properties of the fluorinated layer are more important than its charge trapping properties and permittivity or polarity to prevent charge injection into the bulk material, although high permittivity and deeply trapped charges in the surface layer would reduce the interface electric field and thus decrease charge injection from the electrodes. The charge transport properties of the fluorinated layer are closely related to its free volume, and oxygen in the reactive gas mixtures has a strong negative influence on the decrease of free volume and thus on the suppression of space charge.
    • 基金项目: 国家自然科学基金(批准号: 50977065, 51077101), 电力设备电气绝缘国家重点实验室(批准号: EIPE11210) 和国家重点基础研究发展计划(973)计划 (批准号: 2009CB724505) 资助的课题.
    • Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 50977065, 51077101), the State Key Laboratory of Electrical Insulation and Power Equipment (Grant No. EIPE11210), and National Program on Key Basic Research Project (973 Program) (Grant No. 2009CB724505).
    [1]

    Hanley T L, Burford R P, Fleming R J, Barber K W 2003 IEEE Electr. Insul. M. 19 13

    [2]

    Montanari G C, Fabiani D 2000 IEEE Trans. DEI 7 322

    [3]

    Zhang Y, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 778

    [4]

    Fleming R J, Pawlowski T, Ammala A, Casey P S, Lawrence K A 2005 IEEE Trans. DEI 12 745

    [5]

    Pawlowski T, Fleming R J, Lang S B 2006 IEEE Trans. DEI 13 1023

    [6]

    Murakami Y, Nemoto M, Okuzumi S, Masada S, Nagao M, Hozumi N, Sekiguchi Y, Murata Y 2008 IEEE Trans. DEI 15 33

    [7]

    Lin Y, Du W, Tu D, Zhong W, Du Q 2005 Polym. Int. 54 465

    [8]

    Wang X, He H Q, Tu D M, Lei C, Du Q G 2008 IEEE Trans. DEI 15 319

    [9]

    Matsui K, TanakaY, Takada T, Maeno T 2004 Proc. IEEE International Conference on Solid Dielectric p201

    [10]

    Gao L Y, Guo WY, Tu D M 2003 IEEE Trans. DEI 10 233

    [11]

    Okamoto T, Kanegami M, Hozumi N 1999 Electr. Eng. Jpn. 126 15

    [12]

    Lewis T J 2002 IEEE Trans. DEI 9 717

    [13]

    Jones J P, Llewellyn J P Lewis T J 2005 IEEE Trans. DEI 12 951

    [14]

    Chen G, Tanaka Y, Takada T, Zhong L 2004 IEEE Trans. DEI 11 113

    [15]

    Murakami Y, Mitsumoto S, Fukuma M, Hozumi N Nagao M 20002 Electr. Eng. Jpn. 138 19

    [16]

    Kharitonov A P 2008 Prog. Org. Coat. 61 192

    [17]

    Tressaud A, Durand E, Labrugere C, Kharitonov A P, Kharitonova L N 2007 J. Fluorine Chem. 128 378

    [18]

    An Z, Yang Q, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 105 064102

    [19]

    An Z, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 106 104112

    [20]

    Jiang Y, An Z, Liu C, Zheng F, Zhang Y 2010 IEEE Trans. DEI 17 1814

    [21]

    An Z, Zhao M, Tang M, Yang Q, Xia Z 2008 Acta Phys. Sin. 57 5859 (in Chinese) [安振连, 赵敏, 汤敏敏, 杨强, 夏钟福 2008 物理学报 57 5859]

    [22]

    Yao J, An Z, Mao M, Zhang Y, Xia Z 2010 Acta Phys. Sin. 59 6508 (in Chinese) [姚俊兰, 安振连, 毛明军, 张冶文, 夏钟福 2010 物理学报 59 6508]

    [23]

    An Z, Zhao M, Yao Y, Zhang Y, Xia Z 2009 J. Phys. D: Appl. Phys. 42 015418

    [24]

    An Z, Mao M, Yao J, Zhang Y, Xia Z 2010 J. Phys. D: Appl. Phys. 43 415302

    [25]

    An Z, Liu C, Chen X, Zheng F, Zhang Y "Influence of Oxygen Impurity in Fluorinating Mixtures on Charge Blocking Properties of Fluorinated Surface Layer of Polyethylene"submitted to IEEE Trans. DEI

    [26]

    An Z, Liu C, Chen X, Zheng F, Zhang Y 2012 J. Phys. D: Appl. Phys.45 035302

    [27]

    Xie C, An Z, Jiang Y, Zheng F, Zhang Y 2009 Proc. International Conference on properties and Applications of Dielectric Materials p895

    [28]

    Kharitonov A P, Taege R, Ferrier G, Piven N P 2005 Surf. Coating Int. B Coating Trans. 88 201

    [29]

    Serra S, Tosatti E, larloii S, Scandolo S, Santoro G 2000 Phys. Rev. Ser. B 62 4389

    [30]

    Ho Y F F, Chen G, Davies A E, Swingler S G, Sutton S J, Hampton R N 2003 IEEE Trans. DEI 10 393

  • [1]

    Hanley T L, Burford R P, Fleming R J, Barber K W 2003 IEEE Electr. Insul. M. 19 13

    [2]

    Montanari G C, Fabiani D 2000 IEEE Trans. DEI 7 322

    [3]

    Zhang Y, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 778

    [4]

    Fleming R J, Pawlowski T, Ammala A, Casey P S, Lawrence K A 2005 IEEE Trans. DEI 12 745

    [5]

    Pawlowski T, Fleming R J, Lang S B 2006 IEEE Trans. DEI 13 1023

    [6]

    Murakami Y, Nemoto M, Okuzumi S, Masada S, Nagao M, Hozumi N, Sekiguchi Y, Murata Y 2008 IEEE Trans. DEI 15 33

    [7]

    Lin Y, Du W, Tu D, Zhong W, Du Q 2005 Polym. Int. 54 465

    [8]

    Wang X, He H Q, Tu D M, Lei C, Du Q G 2008 IEEE Trans. DEI 15 319

    [9]

    Matsui K, TanakaY, Takada T, Maeno T 2004 Proc. IEEE International Conference on Solid Dielectric p201

    [10]

    Gao L Y, Guo WY, Tu D M 2003 IEEE Trans. DEI 10 233

    [11]

    Okamoto T, Kanegami M, Hozumi N 1999 Electr. Eng. Jpn. 126 15

    [12]

    Lewis T J 2002 IEEE Trans. DEI 9 717

    [13]

    Jones J P, Llewellyn J P Lewis T J 2005 IEEE Trans. DEI 12 951

    [14]

    Chen G, Tanaka Y, Takada T, Zhong L 2004 IEEE Trans. DEI 11 113

    [15]

    Murakami Y, Mitsumoto S, Fukuma M, Hozumi N Nagao M 20002 Electr. Eng. Jpn. 138 19

    [16]

    Kharitonov A P 2008 Prog. Org. Coat. 61 192

    [17]

    Tressaud A, Durand E, Labrugere C, Kharitonov A P, Kharitonova L N 2007 J. Fluorine Chem. 128 378

    [18]

    An Z, Yang Q, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 105 064102

    [19]

    An Z, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 106 104112

    [20]

    Jiang Y, An Z, Liu C, Zheng F, Zhang Y 2010 IEEE Trans. DEI 17 1814

    [21]

    An Z, Zhao M, Tang M, Yang Q, Xia Z 2008 Acta Phys. Sin. 57 5859 (in Chinese) [安振连, 赵敏, 汤敏敏, 杨强, 夏钟福 2008 物理学报 57 5859]

    [22]

    Yao J, An Z, Mao M, Zhang Y, Xia Z 2010 Acta Phys. Sin. 59 6508 (in Chinese) [姚俊兰, 安振连, 毛明军, 张冶文, 夏钟福 2010 物理学报 59 6508]

    [23]

    An Z, Zhao M, Yao Y, Zhang Y, Xia Z 2009 J. Phys. D: Appl. Phys. 42 015418

    [24]

    An Z, Mao M, Yao J, Zhang Y, Xia Z 2010 J. Phys. D: Appl. Phys. 43 415302

    [25]

    An Z, Liu C, Chen X, Zheng F, Zhang Y "Influence of Oxygen Impurity in Fluorinating Mixtures on Charge Blocking Properties of Fluorinated Surface Layer of Polyethylene"submitted to IEEE Trans. DEI

    [26]

    An Z, Liu C, Chen X, Zheng F, Zhang Y 2012 J. Phys. D: Appl. Phys.45 035302

    [27]

    Xie C, An Z, Jiang Y, Zheng F, Zhang Y 2009 Proc. International Conference on properties and Applications of Dielectric Materials p895

    [28]

    Kharitonov A P, Taege R, Ferrier G, Piven N P 2005 Surf. Coating Int. B Coating Trans. 88 201

    [29]

    Serra S, Tosatti E, larloii S, Scandolo S, Santoro G 2000 Phys. Rev. Ser. B 62 4389

    [30]

    Ho Y F F, Chen G, Davies A E, Swingler S G, Sutton S J, Hampton R N 2003 IEEE Trans. DEI 10 393

计量
  • 文章访问数:  3505
  • PDF下载量:  567
  • 被引次数: 0
出版历程
  • 收稿日期:  2011-07-03
  • 修回日期:  2012-05-10
  • 刊出日期:  2012-05-05

表层氟化聚乙烯中的空间电荷

  • 1. 同济大学物理系先进微结构材料教育部重点实验室, 上海 200092;
  • 2. 西安交通大学电力设备电气绝缘国家重点实验室, 西安 710049
    基金项目: 

    国家自然科学基金(批准号: 50977065, 51077101), 电力设备电气绝缘国家重点实验室(批准号: EIPE11210) 和国家重点基础研究发展计划(973)计划 (批准号: 2009CB724505) 资助的课题.

摘要: 本文试图简要地汇集近年来与近期我们所取得的关于表面氟化对聚乙烯(PE) 空间电荷行为影响的研究结果, 总结与探讨PE中的空间电荷积累与其氟化层特性和特征间的关联. 这些结果显示在氟化反应气中没有氧存在时一个非常薄的氟化层能产生有效的电荷抑制, 而当氧存在时为达到有效的电荷阻挡、需要一个具有高氟化度的非常厚的氟化层. 在影响空间电荷的诸电学因素中, 氟化层的电荷传导特性比其电荷俘获特性和介电常数或极性对阻止电荷注入材料内部更为重要, 尽管氟化层的高介电常数和被俘获的电荷会降低界面电场、因此减少电荷的电极注入. 氟化层的电荷传导特性密切关联于其自由体积, 反应混合气中存在的氧对减小自由体积、因此对电荷的抑制具有强的负面影响.

English Abstract

参考文献 (30)

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