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中国物理学会期刊

不同释放高度的化学物质的电离层扰动特性

CSTR: 32037.14.aps.62.209401

Ionospheric disturbances produced by chemical releases at different release altitudes

CSTR: 32037.14.aps.62.209401
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  • 在电离层释放H2O, CO2, H2和SF6等中性气体能导致释放区域电子损耗, 形成明显的人工电离层洞, 是电离层人工变态的重要而有效的手段之一. 本文在改进电离层化学物质释放三维动力学模型的基础上, 对不同释放量级的H2O 和SF6在不同释放高度下产生的电离层洞形态结构及其时空演化规律进行了系统对比研究, 探讨了释放高度对化学物质释放电离层扰动效果、电离层洞形态及其动力学特性等的影响, 并对其成因进行了分析.

     

    As one of important and effective means for modifying the ionosphere, releases of neutral gases including H2O, CO2, H2, SF6, etc. can produce artificial ionospheric holes. In this paper, the ionospheric disturbances produced under various release conditions, including use of different release species (H2O and SF6), different release altitudes, and different amounts of released substance, are investigated based on an improved three-dimensional chemical release dynamics model which includes neutral gas diffusion, chemical reaction and the ambipolar diffusion of the plasma. The effects of release altitudes and release amount on ionospheric disturbances, morphology and the dynamics of ionospheric hole are studied. Furthermore, the results are also briefly discussed.

     

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