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为分析恶劣空间辐射环境导致星敏感器性能退化、姿态测量精度降低的原因, 深入研究了60Co-γ 射线辐射环境下互补金属氧化物半导体有源像素传感器(complementary metal oxide semiconductor active pixel sensor, CMOS APS)电离总剂量效应对星敏感器星图识别的影响机理. 通过搭建外场观星试验系统, 实际观测天顶和猎户座天区, 经过星图数据采集、星点提取与星图识别等试验流程, 获得60Co-γ 射线辐照后CMOS APS噪声对星图背景灰度均值、识别星点数量的影响机理, 并提出一种寻找被辐射噪声湮没星点的识别算法. 通过理论推导分别建立了CMOS APS暗电流噪声、暗信号非均匀性噪声和光响应非均匀性噪声与星点质心定位误差的定量关系. 研究结果表明60Co-γ 射线辐照后星敏感器星图背景灰度均值增大、星点识别数量减少, CMOS APS辐照后噪声增大导致星点质心定位误差增大, 从而影响星敏感器的姿态定位精度, 该研究结果为高精度星敏感器的设计和抗辐射加固提供一定的理论依据.
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关键词:
- 星敏感器 /
- 辐射损伤机理 /
- 星图识别 /
- 互补金属氧化物半导体有源像素传感器 /
- 识别算法
In order to analyze the causes of star sensor performance degradation and attitude measurement accuracy reduction in space radiation environment, the total ionizing dose effects on complementary metal oxide semiconductor (CMOS) star sensor performance are studied. By using an established outfield star sensor test system, the Orion Nebula and the zenith direction of the sky are imaged. Through the experimental processes of star map data acquisition, star point extraction and star map matching, the influence mechanisms of complementary metal oxide semiconductor active pixel sensor (CMOS APS) noises on background gray mean value of star map and number of identified stars are analyzed. A recognition algorithm for finding stars annihilated by radiated noise is proposed. Through theoretical derivation, the quantitative relationships between CMOS APS dark current noise, dark signal non-uniformity noise and photon response non-uniformity noise and star centroid positioning error are established. The γ radiation results show that the image gray-mean of the whole star map increases, the number of identified stars decreases, and the star point centroid positioning accuracy decreases, which seriously affect star map recognition of star sensor. This research provides a theoretical basis for the radiation-resistant reinforcement design of high precision star sensors.-
Keywords:
- star sensor /
- radiation damage mechanism /
- star map recognition /
- complementary metal oxide semiconductor active pixel sensor /
- recognition algorithm
[1] 于朝霞, 王有峰, 韩飞, 梁彦, 贺亮 2013 上海航天 30 65Google Scholar
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[4] Eisenman A R, Liebe C C 1998 IEEE Aerospace Conference Proceedings Snowmass, CO, USA, March 28, 1998 p111
[5] Liebe C C 1995 IEEE Aerosp. Electron. Syst. Mag. 10 10Google Scholar
[6] 刘垒, 张路, 郑辛, 余凯, 葛升民 2007 红外与激光工程 36 529Google Scholar
Liu L, Zhang L, Zheng X, Xu K, Ge S M 2007 Infrared and Laser Engineering 36 529Google Scholar
[7] 曹中祥, 钟红军, 张运方, 李全良 2018 空间控制技术与应用 44 46Google Scholar
Cao Z X, Zhong H J, Zhang Y F, Li Q L 2018 Aerospace Control and Application 44 46Google Scholar
[8] Virmontois C, Goiffon V, Magnan P, Girard S, Inguimbert C, Petit S, Rolland G, Saint-Pe O 2010 IEEE TNS. 7 3101Google Scholar
[9] Virmontois C, Goiffon V, Magnan P, Girard S, Saint-Pe O, Petit S, Rolland G, Bardoux A 2012 IEEE TNS. 59 927Google Scholar
[10] 周建涛, 蔡伟, 武延鹏, 卢欣 2010 宇航学报 31 24Google Scholar
Zhou J T, Cai W, Wu Y P, Lu X 2010 J. Astron. 31 24Google Scholar
[11] Belenky A, Fish A, Spivak A, Yadid-Pecht O 2007 IEEE Trans. Circuits Syst. Express Briefs. 54 1032Google Scholar
[12] Goiffon V, Virmontois C, Magnan P, Cervantes P, Place S, Gaillardin M, Girard S, Paillet P, Estribeau M, Martin-Gonthier P 2012 Trans. Nucl. Sci. 59 918Google Scholar
[13] 刘金国, 李杰, 郝志航 2016 光学精密工程 14 553
Liu J Q, Li J, Hao Z H 2016 Optics and Precision Engineering 14 553
[14] Yuan Z, Zhang H, Sun Y 2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE) Harbin, China Dec 25–27, 2020 p2485
[15] EMVA1288 Working Group 2010 EMVA Standard 1288 (Frankfurt: European Machine Vision Association)
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图 1 8T CMOS图像传感器像素单元结构示意图(PMD, 金属前介质; TG, 传输栅; RS, 行选择器; RST, 复位晶体管; VDD, 器件内部工作电压; PC, 预充电晶体管)
Fig. 1. Structure diagram of 8T CMOS image sensor pixel unit (PMD, pre-metal dielectric; TG, transfer gate; RS, row select transistor; RST, reset transistor; VDD, device internal operating voltage; PC, pre-charge transistor).
表 1 星敏感器每个剂量点不同积分时间所采集星图的背景灰度均值
Table 1. Image gray-mean of the whole star map with different integration time and different dose levels.
累积剂量/krad(Si) 积分时间/ms 背景灰度均值/e– 7.5 95.6 5381.3 143.4 5381.7 525.6 5413.7 10.0 95.6 6850.6 143.4 6842.1 525.6 6911.3 20.0 95.6 15337.5 143.4 15385.2 525.6 15394.1 50.0 95.6 26813.5 143.4 26828.3 525.6 26836.6 表 2 不同累积剂量下星敏感器识别星点数目
Table 2. Number of star points identified by star sensors at different cumulative doses.
累积剂量/krad(Si) 识别星点数目 0 11 7.5 10 10.0 9 20.0 7 50.0 5 -
[1] 于朝霞, 王有峰, 韩飞, 梁彦, 贺亮 2013 上海航天 30 65Google Scholar
Yu Z X, Wang Y F, Han F, Liang Y, He L 2013 Aerospace Shanghai 30 65Google Scholar
[2] Zheng X, Huang Y, Mao X, He F, Ye Z 2020 JPCS 1510 012027Google Scholar
[3] Hancock B R, Stirbl R C, Cunningham T J, Pain B, Wrigley C J, Ringold P G 2001 Functional Integration of Opto-electro-mechanical Devices & Systems 4284 43Google Scholar
[4] Eisenman A R, Liebe C C 1998 IEEE Aerospace Conference Proceedings Snowmass, CO, USA, March 28, 1998 p111
[5] Liebe C C 1995 IEEE Aerosp. Electron. Syst. Mag. 10 10Google Scholar
[6] 刘垒, 张路, 郑辛, 余凯, 葛升民 2007 红外与激光工程 36 529Google Scholar
Liu L, Zhang L, Zheng X, Xu K, Ge S M 2007 Infrared and Laser Engineering 36 529Google Scholar
[7] 曹中祥, 钟红军, 张运方, 李全良 2018 空间控制技术与应用 44 46Google Scholar
Cao Z X, Zhong H J, Zhang Y F, Li Q L 2018 Aerospace Control and Application 44 46Google Scholar
[8] Virmontois C, Goiffon V, Magnan P, Girard S, Inguimbert C, Petit S, Rolland G, Saint-Pe O 2010 IEEE TNS. 7 3101Google Scholar
[9] Virmontois C, Goiffon V, Magnan P, Girard S, Saint-Pe O, Petit S, Rolland G, Bardoux A 2012 IEEE TNS. 59 927Google Scholar
[10] 周建涛, 蔡伟, 武延鹏, 卢欣 2010 宇航学报 31 24Google Scholar
Zhou J T, Cai W, Wu Y P, Lu X 2010 J. Astron. 31 24Google Scholar
[11] Belenky A, Fish A, Spivak A, Yadid-Pecht O 2007 IEEE Trans. Circuits Syst. Express Briefs. 54 1032Google Scholar
[12] Goiffon V, Virmontois C, Magnan P, Cervantes P, Place S, Gaillardin M, Girard S, Paillet P, Estribeau M, Martin-Gonthier P 2012 Trans. Nucl. Sci. 59 918Google Scholar
[13] 刘金国, 李杰, 郝志航 2016 光学精密工程 14 553
Liu J Q, Li J, Hao Z H 2016 Optics and Precision Engineering 14 553
[14] Yuan Z, Zhang H, Sun Y 2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE) Harbin, China Dec 25–27, 2020 p2485
[15] EMVA1288 Working Group 2010 EMVA Standard 1288 (Frankfurt: European Machine Vision Association)
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