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中国物理学会期刊

利用脉冲激光沉积外延制备CsSnBr3/Si异质结高性能光电探测器

CSTR: 32037.14.aps.73.20231645

High-performance CsSnBr3/Si PN heterojunction photodetectors prepared by pulsed laser deposition epitaxy

CSTR: 32037.14.aps.73.20231645
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  • 钙钛矿半导体具有光吸收系数高、载流子扩散长度大和荧光量子效率高等优异物理特性, 已在光电探测器、太阳能电池等领域展现出重要的应用潜力. 但卤化铅钙钛矿的环境毒性和稳定性大大限制了该类器件的应用范围. 因此, 寻找低毒、稳定的非铅钙钛矿半导体尤为重要. 利用锡元素替代铅元素并生长高质量的锡基钙钛矿薄膜是实现其光电器件应用的可行方案. 本文采用脉冲激光沉积方法, 在N型单晶硅(100)衬底上外延生长了一层(100)取向的CsSnBr3钙钛矿薄膜. 霍尔效应及电学测试结果表明, 基于CsSnBr3/Si半导体异质结在暗态下具有明显的异质PN结电流整流特征, 在光照下具有显著的光响应行为, 并具有可自驱动、高开关比(104)以及毫秒量级响应/恢复时间等优良光电探测器件性能. 本文研究结果表明利用脉冲激光沉积方法在制备新型钙钛矿薄膜异质结、实现快速灵敏的光电探测方面具有重要应用前景.

     

    Halide perovskite semiconductors have outstanding physical properties such as high light absorption coefficient, large carrier diffusion length, and high photoluminescence quantum efficiency, and demonstrate significant potential applications in optoelectronic devices such as photodetectors and solar cells. However, the toxicity and environmental instability associated with lead-based perovskites significantly limit their applications. An attractive solution is substituting tin for lead in perovskites and growing high-quality tin-based perovskite films. In this study, we adopt the pulsed laser deposition method to achieve the epitaxial growth of CsSnBr3 films on silicon substrates. The morphologies, optical and electrical properties of the CsSnBr3 films, as well as the CsSnBr3/Si heterojunction detectors, are comprehensively investigated with various characterization techniques, including XRD 2θ-ω and φ scans, atomic force microscope, scanning electron microscope, photoluminescence and time-resolved photoluminescence spectroscopy, and Hall electrical measurements. The results indicate that such a CsSnBr3 film grows epitaxially onto the silicon substrate via a face-to-face mode. Interestingly, an unusual temperature-dependent bandgap increase is found to be due to the high electron effective mass of CsSnBr3. The CsSnBr3 film shows the P-type semiconductor behavior with a high mobility of 122 cm²/(V·s), enabling the formation of an ideal Type-II heterojunction with the silicon substrate. The CsSnBr3/Si semiconductor heterojunction detector exhibits distinctive heterojunction PN diode characteristics in the dark and a pronounced photoresponse under illumination. At zero bias, the detector displays a switch ratio exceeding 104, responsivity of 0.125 mA/W, external quantum efficiency of 0.0238%, detectivity (D^* ) of 2.1×109 Jones, response time 3.23 ms, and recovery time of 4.87 ms. Under a small bias of –1 V, the switch ratio decreases to 50, but responsivity and external quantum efficiency increase by 568 times. The detectors can maintain self-powered operation state with a high switch ratio of 104, millisecond-level response time and millisecond-level recovery time. In conclusion, this work presents a self-powering, high-performance photodetector based on CsSnBr3 epitaxial films integrated with silicon substrates.

     

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