Investigation of laser-induced single event effect on SiGe BiCMOS low noise amplifiers

Li Pei; Dong Zhi-Yong; Guo Hong-Xia; Zhang Feng-Qi; Guo Ya-Xin; Peng Zhi-Gang; He Chao-Hui

doi:10.7498/aps.73.20231451

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Li Pei, Dong Zhi-Yong, Guo Hong-Xia, Zhang Feng-Qi, Guo Ya-Xin, Peng Zhi-Gang, He Chao-Hui. Investigation of laser-induced single event effect on SiGe BiCMOS low noise amplifiersJ. Acta Physica Sinica, 2024, 73(4): 044301. DOI: 10.7498/aps.73.20231451

Citation:

Li Pei, Dong Zhi-Yong, Guo Hong-Xia, Zhang Feng-Qi, Guo Ya-Xin, Peng Zhi-Gang, He Chao-Hui. Investigation of laser-induced single event effect on SiGe BiCMOS low noise amplifiersJ. Acta Physica Sinica, 2024, 73(4): 044301. DOI: 10.7498/aps.73.20231451

Citation:

Li Pei, Dong Zhi-Yong, Guo Hong-Xia, Zhang Feng-Qi, Guo Ya-Xin, Peng Zhi-Gang, He Chao-Hui. Investigation of laser-induced single event effect on SiGe BiCMOS low noise amplifiersJ. Acta Physica Sinica, 2024, 73(4): 044301. DOI: 10.7498/aps.73.20231451